| |
|
|
| |
|
|
| Testing Embedded Software (including smart devices) using an Error Taxonomy |
|
The embedded software world can have errors (bugs) just like the rest of the software world, and so needs testing. Embedded software can cause loss of hardware, product crashes, and even death in markets such as medical, controls, mobile-telecom, aero-space, and automotive devices.
It is surprising how few studies have been done collecting and categorizing the types of errors that are reported from the embedded software world. A few error studies have identified in the embedded domain and will be included in this session, but little work has been done turning what is available in the public domain into what is known as an error taxonomy.
Jon Hagar presents the concept of what error taxonomy is and how one can be used to guide embedded test planning. Then the presentation reviews the public data and an embedded error taxonomy with project applicable test concepts that this data indicates. Finally some implications and conclusions from the data are summarized with recommendations for future study. |
|
|
 |
|
Biography
|
|
| |
Jon D. Hagar
is a systems-software engineer and tester consultant supporting software product integrity, verification, and validation with a specialization in embedded/mobile software systems. Jon has worked in software engineering, particularly testing for over thirty years. Embedded projects he has supported include: control system (avionics and auto), spacecraft, mobile-smart devices, and ground systems (IT) as well as working attack testing of the new smart phones (class/book in work). |
| |
|
He has managed and built embedded test lab with test automation. He teaches classes at the professional and college level.
Jon publishes regularly with over 50 presentations and parts of 3 book in software testing, verification, validation, Agile, product integrity and assessment, system engineering, and quality assurance. Jon is lead editor/author on ISO 29119 software testing standard, model based test standard, and IEEE 1012 V&V plans.
|
| |
|
